Openex Ceramic Wafer Inspection Machine offers ultra-fast, AI-enhanced visual inspection for ceramic chips. Detects defects such as electrode unevenness, edge damage, cracks, contamination, and deformation with up to 800 pcs/min speed.
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Discover Openex's fully autonomous Phosphor Sheet Wafer AOI system. This case study details how our Hybrid AI Vision, 10K/UPH high-speed marking, and deep process innovations solve micro-defect detection challenges, offering a superior alternative to imported equipment.
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